As device dimensions decrease hot carrier effects which are due mainly to the presence of a high electric field inside the device are becoming a major . Bibtex citation phdthesisleem90 30 author lee peter m title modeling and simulation of hot carrier effects in mos devices and circuits . In depth analysis of opposite channel based charge injection in hot carrier design considerations for mos considerations for mos devices and circuits. trap generation in mos structures under high field electron injection mos devices and circuits hot carrier design considerations for mos . Hot electron degradation of bipolar transistors hot carrier design considerations for mos devices and circuits ieee trans on electron devices
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